Dr. Jaime Calvo-Gallego received his B.Sc. degree in telecommunication engineering from the Universidad de Valladolid (UVA), his M.Sc. degree in telecommunication engineering from the Universidad Politécnica de Valencia (UPV), and his Ph.D. degree in telecommunication engineering (Dr. Ing.) from the Universidad Politécnica de Madrid (UPM). For several years, he worked as Project Engineer in the company INDRA SISTEMAS S.A., he was an Assistant Professor with the UPM and with the Universidad Carlos III de Madrid (UC3M), and he was Chercheur Invité at L’Institut d’Électronique Fondamentale, Université Paris-Sud (U-PSUD) – CNRS, Paris, France. He is currently an Associate Professor at the Universidad de Salamanca (USAL), Zamora, Spain. His research interest is focused on technologies to industry, medicine, education, and communications.

EMAIL: jaime.calvo@usal.es

Sub-THz Response of Strained-Silicon MODFETs
Juan A. Delgado-Notario, Elham Javadi, Jaime Calvo-Gallego, Enrique Diez, Yahya M. Meziani, Jesús E. Velázquez-Pérez,* and Kristel Fobelets*
Phys. Status Solidi A 2017, 1700475 (2017)''

Sub-Micron Gate Length Field Effect Transistors as Broad Band Detectors of Terahertz Radiation
J. A. Delgado Notario, E. Javadi, J. Calvo-Gallego, E. Diez, J. E. Velázquez, and Y. M. Meziani
International Journal of High Speed Electronics and Systems Vol. 25, Nos. 3 & 4 (2016) 1640020 (2016)''

Terahertz time domain spectroscopy for chemical identification
Garcia-Garcia, E., Diez, E., Meziani, Y.M., Velazquez-Perez, J.E., Calvo-Gallego, J.,
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013, art. no. 6481377, pp. 199-202. (2013)''

Effect of the gate scaling on the analogue performance of s-Si CMOS devices
Fobelets, K., Calvo-Gallego, J., Velazquez-Pérez, J.E.,
Semiconductor Science and Technology, 26 (9), art. no. 095030. (2011)''

Analysis of RF noise performance of Si/SiGe pseudomorphic MOSFETs
Calvo-Gallego, J., Fobelets, K., Velazquez Pérez, J.E.
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09, art. no. 4800538, pp. 479-482. (2009)''