Probe station

The Summit series semi-automated probe systems 11000B, with PureLine™ and AttoGuard® technologies, allow us to access the full range of test instruments for wafers up to 200 mm. Summit series probe systems are easy to configure with your choice of measurement performance, chuck size, and microscope options. The station is connected via triaxial cables to different instruments: semiconductor device analyzer (B1500A), sourcemeters, current sources, lockin-amplifier, and others. Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. Keysight EasyEXPERT GUI based characterization software is available to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization  process from measurement setup and execution to analysis and data management. EasyEXPERT makes it easy to perform complex device characterization immediately with hundreds of ready-to-use measurements (application tests) furnished, and allows the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight B1500A provides the complete solution for device characterization with these versatile capabilities.